Open AccessA Comparative Study of Two Diagnostic Methods Based on the Switching Voltage Pattern for IGBT Open-Circuit Faults in Voltage-Source Inverters
Author(s) -
Yuxi Wang,
Zhan Li,
Minghui Xu,
Hao Ma
Publication year - 2016
Publication title -
journal of power electronics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.23
H-Index - 33
eISSN - 2093-4718
pISSN - 1598-2092
DOI - 10.6113/jpe.2016.16.3.1087
Subject(s) - insulated gate bipolar transistor , voltage source , voltage , open circuit voltage , inverter , engineering , voltage source inverter , line (geometry) , electronic engineering , short circuit , electrical engineering , half bridge , computer science , control theory (sociology) , mathematics , artificial intelligence , geometry , control (management)
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