Open AccessInterface trap density distribution in 3D sequential Integrated-Circuit and Its effect
Author(s) -
Tae Jun Ahn,
Si Hyun Lee,
Yun Seop Yu
Publication year - 2015
Publication title -
han-guk jeongbo tongsin hakoe nonmunji
Language(s) - English
Resource type - Journals
eISSN - 2288-4165
pISSN - 2234-4772
DOI - 10.6109/jkiice.2015.19.12.2899
Subject(s) - trap (plumbing) , transistor , materials science , threshold voltage , inverter , interface (matter) , charge density , voltage , dielectric , optoelectronics , charge (physics) , electrical engineering , physics , engineering , composite material , meteorology , capillary number , quantum mechanics , capillary action