z-logo
open-access-imgOpen Access
Metrological traceability frequently asked questions and NIST policy
Author(s) -
Antonio Possolo,
Sally S. Bruce,
Robert L Watters Jr
Publication year - 2021
Language(s) - English
Resource type - Reports
DOI - 10.6028/nist.tn.2156
Subject(s) - traceability , nist , metrology , requirements traceability , terminology , computer science , engineering , engineering management , software engineering , mathematics , statistics , linguistics , requirements analysis , natural language processing , programming language , philosophy , software , requirement

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom