Open AccessMetrological Tools for the Reference Materials and Reference Instruments of the NIST Material Measurement Laboratory
Author(s) -
Carlos Beauchamp,
Johanna E. Camara,
Jennifer Carney,
Steven J. Choquette,
Kenneth D. Cole,
Paul C. DeRose,
David L. Duewer,
Michael Epstein,
Margaret C. Kline,
Katrice A. Lippa,
Enrico Lucon,
John J. Molloy,
Michael A. Nelson,
Karen W. Phinney,
Maria Polakoski,
Antonio Possolo,
Lane C. Sander,
John E. Schiel,
Katherine E. Sharpless,
Blaza Toman,
Michael R. Winchester,
D. Windover
Publication year - 2021
Language(s) - English
Resource type - Reports
DOI - 10.6028/nist.sp.260-136-2021
Subject(s) - nist , comparability , traceability , metrology , standardization , computer science , engineering , software engineering , mathematics , statistics , natural language processing , combinatorics , operating system