Open AccessExtending the Notion of Quality from Physical Metrology to Information and Sustainability
Author(s) -
Gaurav Ameta,
Sudarsan Rachuri,
Xenia Fiorentini,
Mahesh Mani,
Steven J. Fenves,
Kevin W. Lyons,
Ram D. Sriram
Publication year - 2008
Language(s) - English
Resource type - Reports
DOI - 10.6028/nist.ir.7517
Subject(s) - sustainability , quality (philosophy) , terminology , metrology , computer science , traceability , triple bottom line , harmonization , management science , information quality , risk analysis (engineering) , systems engineering , engineering , information system , business , mathematics , software engineering , epistemology , ecology , philosophy , linguistics , statistics , physics , electrical engineering , acoustics , biology