Open AccessExtending the notion of quality from physical metrology to information and sustainability
Author(s) -
Gaurav Ameta,
Sudarsan Rachuri,
Xenia Fiorentini,
Mahesh Mani,
Steven J. Fenves,
Kevin W. Lyons,
Ram D. Sriram
Publication year - 2008
Language(s) - English
Resource type - Reports
DOI - 10.6028/nist.ir.7517
Subject(s) - metrology , sustainability , quality (philosophy) , production (economics) , computer science , engineering , mathematics , economics , statistics , physics , microeconomics , ecology , biology , quantum mechanics
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