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Materials reliability, FY 2003 programs and accomplishments
Author(s) -
Jim St Pierre,
Thomas A. Siewert
Publication year - 2003
Language(s) - English
Resource type - Reports
DOI - 10.6028/nist.ir.7015
Subject(s) - reliability (semiconductor) , computer science , reliability engineering , database , engineering , physics , power (physics) , quantum mechanics

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