Open AccessThermal spray process reliability:
Author(s) -
Stephen D. Ridder
Publication year - 2001
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.6028/nist.ir.6776
Subject(s) - reliability (semiconductor) , reliability engineering , process (computing) , computer science , process engineering , materials science , engineering , thermodynamics , physics , programming language , power (physics)