A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films | Zendy

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A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films

Author(s) -

Frank L. McCrackin

Publication year - 1964

Language(s) - English

Resource type - Reports

DOI - 10.6028/nbs.tn.242

Subject(s) - fortran , ellipsometry , reflection (computer programming) , computer program , computer science , optics , materials science , thin film , programming language , physics , nanotechnology

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