Open AccessA Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films
Author(s) -
Frank L. McCrackin
Publication year - 1964
Language(s) - English
Resource type - Reports
DOI - 10.6028/nbs.tn.242
Subject(s) - fortran , ellipsometry , reflection (computer programming) , computer program , computer science , optics , materials science , thin film , programming language , physics , nanotechnology