Open AccessCalculations for comparing two-point and four-point probe resistivity measurements on rectangular bar-shaped semiconductor samples.
Author(s) -
L. J. Swartzendruber
Publication year - 1964
Language(s) - English
Resource type - Reports
DOI - 10.6028/nbs.tn.241
Subject(s) - bar (unit) , point (geometry) , semiconductor , electrical resistivity and conductivity , materials science , condensed matter physics , physics , geometry , mathematics , optoelectronics , engineering , electrical engineering , meteorology