
Measurement of transistor scattering parameters
Author(s) -
George J. Rogers,
Daniel S. Sawyer,
R L. Jesch
Publication year - 1975
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.6028/nbs.sp.400-5
Subject(s) - transistor , scattering , optoelectronics , materials science , computer science , environmental science , physics , optics , electrical engineering , engineering , voltage