Microelectronic test pattern NBS-4 | Zendy

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Microelectronic test pattern NBS-4

Author(s) -

W. R. Thurber,

M. Buehler

Publication year - 1978

Language(s) - Uncategorized

Resource type - Reports

DOI - 10.6028/nbs.sp.400-32

Subject(s) - microelectronics , test (biology) , computer science , nanotechnology , materials science , geology , paleontology

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