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Ellipsometry in the measurement of surfaces and thin films :
Author(s) -
Robert R. Stromberg,
Eliο Passaglia
Publication year - 1964
Language(s) - English
Resource type - Reports
DOI - 10.6028/nbs.mp.256
Subject(s) - ellipsometry , thin film , materials science , analytical chemistry (journal) , chemistry , nanotechnology , chromatography

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