Open AccessAn NMOS test chip for a course in semiconductor parameter measurements
Author(s) -
K.P. Roenker,
L.W. Linholm
Publication year - 1984
Language(s) - English
Resource type - Reports
DOI - 10.6028/nbs.ir.84-2822
Subject(s) - nmos logic , course (navigation) , chip , test (biology) , semiconductor , materials science , optoelectronics , electrical engineering , engineering , geology , transistor , paleontology , voltage , aerospace engineering