Open AccessMicroelectronic test patterns NBS-12 and NBS-24
Author(s) -
G. P. Carver,
R. L. Mattis,
M. Buehler
Publication year - 1981
Language(s) - English
Resource type - Reports
DOI - 10.6028/nbs.ir.81-2234
Subject(s) - microelectronics , test (biology) , engineering , electrical engineering , geology , paleontology