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Measurement techniques for high power semiconductor materials and devices :
Author(s) -
F F Oettinger,
R D Larrabee
Publication year - 1980
Language(s) - English
Resource type - Reports
DOI - 10.6028/nbs.ir.80-2061
Subject(s) - semiconductor , power (physics) , semiconductor device , electrical engineering , materials science , optoelectronics , engineering physics , computer science , engineering , nanotechnology , physics , layer (electronics) , quantum mechanics

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