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Measurement techniques for high power semiconductor materials and devices :
Author(s) -
R.C. Larrabee,
W. E. Phillips,
W. R. Thurber
Publication year - 1979
Language(s) - English
Resource type - Reports
DOI - 10.6028/nbs.ir.79-1756
Subject(s) - semiconductor , power (physics) , semiconductor device , materials science , optoelectronics , electrical engineering , engineering physics , computer science , engineering , nanotechnology , physics , layer (electronics) , quantum mechanics

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