Open AccessControl of mobile-ion contamination in oxidation ambients for MOS device processing
Author(s) -
S. Mayo,
Richard Y. Koyama,
Thomas F Leedy
Publication year - 1978
Language(s) - English
Resource type - Reports
DOI - 10.6028/nbs.ir.77-1404
Subject(s) - contamination , contamination control , ion , computer science , materials science , environmental science , radiochemistry , chemistry , biology , organic chemistry , ecology
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