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The structure of slow crack interfaces in silicon nitride
Author(s) -
N J Tighe
Publication year - 1976
Language(s) - English
Resource type - Reports
DOI - 10.6028/nbs.ir.76-1075
Subject(s) - materials science , nitride , silicon nitride , silicon , composite material , engineering physics , optoelectronics , engineering , layer (electronics)

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