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Accuracy barriers of quantitative electron beam x-ray microanalysis - Foreword
Author(s) -
D. E. Newbury,
Ryna B. Marinenko
Publication year - 2002
Publication title -
journal of research of the national institute of standards and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.202
H-Index - 59
eISSN - 2165-7254
pISSN - 1044-677X
DOI - 10.6028/jres.107.001
Subject(s) - microanalysis , electron probe microanalysis , cathode ray , materials science , x ray , electron , optics , physics , nuclear physics , chemistry , scanning electron microscope , organic chemistry

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