Open AccessMultitechnique approach to trace characterization of high-purity materials - Gallium
Author(s) -
S. Gangadhaŕan,
S. Natarajan,
J. Arunachalam,
Sunil Jaikumar,
S. V. Burangey
Publication year - 1988
Publication title -
journal of research of the national bureau of standards
Language(s) - English
Resource type - Journals
eISSN - 2376-5259
pISSN - 0160-1741
DOI - 10.6028/jres.093.093
Subject(s) - gallium , characterization (materials science) , materials science , trace (psycholinguistics) , radiochemistry , analytical chemistry (journal) , nanotechnology , chemistry , environmental chemistry , metallurgy , linguistics , philosophy