Open AccessDepth profiling of trace constituents using secondary ion mass-spectrometry
Author(s) -
C. W. Magee
Publication year - 1988
Publication title -
journal of research of the national bureau of standards
Language(s) - English
Resource type - Journals
eISSN - 2376-5259
pISSN - 0160-1741
DOI - 10.6028/jres.093.088
Subject(s) - mass spectrometry , profiling (computer programming) , secondary ion mass spectrometry , ion mobility spectrometry–mass spectrometry , analytical chemistry (journal) , chemistry , chromatography , selected reaction monitoring , tandem mass spectrometry , computer science , operating system