Open AccessAnalysis at the atomic level - The atom probe field-ion microscope
Author(s) -
M.K. Miller
Publication year - 1988
Publication title -
journal of research of the national bureau of standards
Language(s) - English
Resource type - Journals
eISSN - 2376-5259
pISSN - 0160-1741
DOI - 10.6028/jres.093.083
Subject(s) - field ion microscope , atom probe , atomic units , materials science , atom (system on chip) , microscope , ion , diffusion , nanotechnology , analytical chemistry (journal) , metallurgy , chemistry , microstructure , physics , optics , thermodynamics , environmental chemistry , quantum mechanics , organic chemistry , computer science , embedded system
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