Open AccessAnalysis at the atomic level - The atom probe field-ion microscope
Author(s) -
M.K. Miller
Publication year - 1988
Publication title -
journal of research of the national bureau of standards
Language(s) - English
Resource type - Journals
eISSN - 2376-5259
pISSN - 0160-1741
DOI - 10.6028/jres.093.083
Subject(s) - field ion microscope , atomic physics , atom (system on chip) , microscope , materials science , field (mathematics) , atom probe , ion , physics , optics , nanotechnology , quantum mechanics , computer science , transmission electron microscopy , embedded system , mathematics , pure mathematics