Open AccessSoft Error Fault Injection Test for Spacecraft Flight Software
Author(s) -
JiHoon Bae,
Hyungshin Kim
Publication year - 2022
Publication title -
journal of the korea academia-industrial cooperation society
Language(s) - English
Resource type - Journals
eISSN - 2288-4688
pISSN - 1975-4701
DOI - 10.5762/kais.2022.23.7.291
Subject(s) - single event upset , spacecraft , software , fault injection , computer science , event (particle physics) , flight test , fault (geology) , embedded system , reliability engineering , aeronautics , engineering , aerospace engineering , simulation , operating system , physics , computer hardware , geology , seismology , static random access memory , quantum mechanics
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