Open AccessA Method of Reliability Growth Test using Failure Data for Multiple Systems
Author(s) -
Yang-Woo Seo,
Young-il Oh,
Seong-Jun Lim,
Chun-Sup Um
Publication year - 2022
Publication title -
han'gug sanhag gi'sul haghoe nonmunji/han-guk sanhak gisul hakoe nonmunji
Language(s) - English
Resource type - Journals
eISSN - 2288-4688
pISSN - 1975-4701
DOI - 10.5762/kais.2022.23.6.262
Subject(s) - reliability engineering , reliability (semiconductor) , test (biology) , computer science , engineering , biology , paleontology , power (physics) , physics , quantum mechanics