Open AccessA Method of Reliability Growth Test Design for One-shot System
Author(s) -
Yang-Woo Seo,
Hee-Wook Kim,
Sojung Kim,
Yong-Geun Kim
Publication year - 2021
Publication title -
han'gug sanhag gi'sul haghoe nonmunji/han-guk sanhak gisul hakoe nonmunji
Language(s) - English
Resource type - Journals
eISSN - 2288-4688
pISSN - 1975-4701
DOI - 10.5762/kais.2021.22.12.546
Subject(s) - reliability (semiconductor) , reliability engineering , gompertz function , test (biology) , mathematics , statistics , computer science , simulation , engineering , physics , geology , thermodynamics , paleontology , power (physics)