Open AccessDefect-Limited Yield Difference Model
Author(s) -
Hoong-Joo Lee
Publication year - 2008
Publication title -
han'gug sanhag gi'sul haghoe nonmunji/han-guk sanhak gisul hakoe nonmunji
Language(s) - Uncategorized
Resource type - Journals
eISSN - 2288-4688
pISSN - 1975-4701
DOI - 10.5762/kais.2008.9.6.1614
Subject(s) - yield (engineering) , significant difference , function (biology) , computer science , mathematics , topology (electrical circuits) , reliability engineering , geometry , algorithm , materials science , statistics , combinatorics , engineering , composite material , evolutionary biology , biology