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Surface Physical Properties of W-N Nano Thin Films by Nanotribological Analysis
Author(s) -
Soo-In Kim,
Kyu-Young Lee,
Jooyoung Kim,
ChangWoo Lee
Publication year - 2011
Publication title -
applied science and convergence technology
Language(s) - English
Resource type - Journals
eISSN - 2288-6559
pISSN - 1225-8822
DOI - 10.5757/jkvs.2011.20.6.456
Subject(s) - nano , nanotribology , nanometre , materials science , nanoscopic scale , nanoindentation , thin film , atomic force microscopy , nanotechnology , composite material , elastic modulus , analytical chemistry (journal) , chemistry , chromatography

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