Open AccessEffect of the Cu Bottom Layer on the Optical and Electrical Properties of In2O3/Cu Thin Films
Author(s) -
Daeil Kim
Publication year - 2011
Publication title -
applied science and convergence technology
Language(s) - English
Resource type - Journals
eISSN - 2288-6559
pISSN - 1225-8822
DOI - 10.5757/jkvs.2011.20.5.356
Subject(s) - sheet resistance , materials science , figure of merit , layer (electronics) , substrate (aquarium) , copper , thin film , transmittance , indium , sputter deposition , indium tin oxide , sputtering , analytical chemistry (journal) , optics , optoelectronics , composite material , metallurgy , nanotechnology , chemistry , physics , oceanography , geology , chromatography
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