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Study on Growth Optimization of InAs/GaSb Strained-Layer Superlattice Structures by High-Resolution XRD Analysis
Author(s) -
J.O. Kim,
Hyun Wook Shin,
J.-W. Choe,
S.J. Lee,
C.S. Kim,
S. K. Noh
Publication year - 2009
Publication title -
applied science and convergence technology
Language(s) - English
Resource type - Journals
eISSN - 2288-6559
pISSN - 1225-8822
DOI - 10.5757/jkvs.2009.18.4.245
Subject(s) - materials science , superlattice , strain (injury) , molecular beam epitaxy , analytical chemistry (journal) , diffraction , layer (electronics) , crystallography , chemistry , nanotechnology , optoelectronics , optics , epitaxy , physics , medicine , chromatography

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