Open AccessModification and Repair of a Carbon Nanotube-based Device Using an Atomic Force Microscope
Author(s) -
JiYong Park,
Yong-Sun Kim,
Young-Mu Oh
Publication year - 2007
Publication title -
applied science and convergence technology
Language(s) - English
Resource type - Journals
eISSN - 2288-6559
pISSN - 1225-8822
DOI - 10.5757/jkvs.2007.16.1.033
Subject(s) - atomic force microscopy , carbon nanotube , materials science , nanotechnology , electrostatic force microscope , conductive atomic force microscopy
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