Open AccessStability of Tip in Adhesion Process on Atomic Force Microscopy Studied by Coupling Computational Model
Author(s) -
Yasuhiro Senda,
Janne Blomqvist,
R. M. Nieminen
Publication year - 2017
Publication title -
applied science and convergence technology
Language(s) - English
Resource type - Journals
eISSN - 2288-6559
pISSN - 1225-8822
DOI - 10.5757/asct.2017.26.1.6
Subject(s) - cantilever , ionic bonding , dissipation , coupling (piping) , adhesive , materials science , adhesion , atomic force microscopy , ion , nanotechnology , chemical physics , mechanics , chemistry , composite material , physics , thermodynamics , organic chemistry , layer (electronics)
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