Open AccessMarch Test for Static Neighborhood Pattern-Sensitive Faults in Random-Access Memories
Author(s) -
Cristina Huzum,
Petru Caşcaval
Publication year - 2012
Publication title -
elektronika ir elektrotechnika
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.224
H-Index - 26
eISSN - 2029-5731
pISSN - 1392-1215
DOI - 10.5755/j01.eee.119.3.1369
Subject(s) - random access , simple (philosophy) , test (biology) , cover (algebra) , grid , computer science , grid cell , algorithm , computer hardware , engineering , programming language , mathematics , geology , geometry , mechanical engineering , paleontology , philosophy , epistemology