Open AccessA Software Measurement Pattern Language for Measurement Planning aiming at SPC
Author(s) -
Monalessa Perini Barcellos,
Monalessa Perini Barcellos,
Santos Gleison
Publication year - 2017
Language(s) - English
Resource type - Conference proceedings
DOI - 10.5753/sbqs.2017.15101
Subject(s) - reuse , computer science , statistical process control , software , plan (archaeology) , productivity , process (computing) , quality (philosophy) , software engineering , process management , engineering , programming language , philosophy , macroeconomics , archaeology , epistemology , economics , history , waste management
The growing interest of organizations in improving their software processes has led them to aim at achieving the high maturity, where statistical process control (SPC) is required. One of the challenges to perform SPC is selecting measures suitable for it. Measures used in SPC can be found in the literature and could be reused by organizations, but information is disperse and non-structured, not favoring reuse. This paper presents MePPLa (Measurement Planning Pattern Language), a pattern language developed based on the findings of a systematic mapping and a survey that investigated measures for SPC. An initial evaluation of MePPLa showed that it favors reuse, contributes to productivity in measurement planning and to the quality of the measurement plan.