Open AccessA RELIABILITY GURANTEED SOLUTION FOR DATA STORING AND SHARING
Author(s) -
Meena Kumari,
D Sreedevi
Publication year - 2022
Publication title -
international research journal of modernization in engineering technology and science
Language(s) - English
Resource type - Journals
ISSN - 2582-5208
DOI - 10.56726/irjmets30970
Subject(s) - reliability (semiconductor) , reliability engineering , computer science , engineering , physics , thermodynamics , power (physics)
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