
Retrospective Exposure Assessment of Wafer Fabrication Workers in the Semiconductor Industry
Author(s) -
Dong-Uk Park
Publication year - 2011
Publication title -
han'guk hwan'gyeong bogeon hakoeji/han'gug hwan'gyeong bo'geon haghoeji
Language(s) - English
Resource type - Journals
eISSN - 2233-8616
pISSN - 1738-4087
DOI - 10.5668/jehs.2011.37.1.012
Subject(s) - workgroup , retrospective cohort study , wafer fabrication , incidence (geometry) , medicine , adverse effect , exposure assessment , cancer incidence , epidemiology , environmental health , surgery , wafer , computer science , engineering , mathematics , computer network , geometry , electrical engineering