Determination of the Dielectric Constant and the Thickness of Polymer Thin Film Based on SPR Curve
Author(s) -
Hendro Hendro,
Rahmat Hidayat,
Dewi Kurnia
Publication year - 2012
Publication title -
jurnal otomasi kontrol dan instrumentasi
Language(s) - English
Resource type - Journals
eISSN - 2085-2517
pISSN - 2460-6340
DOI - 10.5614/joki.2011.3.2.2
Subject(s) - dielectric , curve fitting , materials science , constant (computer programming) , layer (electronics) , standard curve , deposition (geology) , optics , composite material , analytical chemistry (journal) , optoelectronics , chemistry , mathematics , physics , chromatography , paleontology , statistics , sediment , computer science , biology , programming language
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