
USING ELECTRICAL IMPEDANCE TOMOGRAPHY IN LINEAR ARRAYS OF MEASUREMENT
Author(s) -
Tomasz Rymarczyk
Publication year - 2017
Publication title -
informatyka, automatyka, pomiary w gospodarce i ochronie środowiska
Language(s) - English
Resource type - Journals
eISSN - 2391-6761
pISSN - 2083-0157
DOI - 10.5604/01.3001.0010.4588
Subject(s) - topology optimization , electrical impedance tomography , sensitivity (control systems) , finite element method , inverse problem , topology (electrical circuits) , level set method , shape optimization , mathematical optimization , optimization problem , electrical impedance , algorithm , tomography , derivative (finance) , computer science , mathematics , electronic engineering , engineering , mathematical analysis , segmentation , structural engineering , physics , electrical engineering , optics , combinatorics , artificial intelligence , financial economics , economics , image segmentation
The article presents an application to the topology optimization in electrical impedance tomography using the level set method. The level set function is based on shape and topology optimization for areas with partly continuous conductivities. The finite element method has been used to solve the forward problem. The proposed algorithm is initialized using topological sensitivity analysis. Shape derivative and material derivative have been incorporated with the level set method to investigate shape optimization problems. The coupled algorithm is a relatively new procedure to overcome this problem. Using the line measurement model is very useful to solve the inverse problem in the copper-mine ceiling and the flood embankment.