
Use of the delayed luminescence test for evaluation of changes in frost-resistance of winter wheat
Author(s) -
A. Brzóstowicz,
Zdzisław Prokowski,
A. Murkowski,
Edward Grabikowski
Publication year - 2013
Publication title -
acta agrobotanica
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.4
H-Index - 9
eISSN - 2300-357X
pISSN - 0065-0951
DOI - 10.5586/aa.1985.001
Subject(s) - frost (temperature) , winter wheat , cultivar , luminescence , hardening (computing) , horticulture , conductivity , winter season , materials science , chemistry , environmental science , agronomy , biology , composite material , geology , climatology , optoelectronics , layer (electronics)
The influence of frost hardening conditions on the frost-resistance of three winter wheat cultivars ('Mironowska 808', 'Grana' and 'Maris Huntsman') was studied. Frost resistance was measured periodically during the autumn and winter season by the delayed luminescence method. Parallelly an electrical conductivity test was performed for comparison. It was found that the temperature which delayed luminescence reaches its maximum (tN) correlates with (t50) obtained by the conductometric method. The differences in response of particular cultivars to frost and hardening conditions are described