Open AccessAdaptive Defect Detection Method based on Skewness of the Histogram in LCD Image
Author(s) -
Eun-Hye Gu,
Kil−Houm Park
Publication year - 2016
Publication title -
jeonja gonghakoe nonmunji
Language(s) - English
Resource type - Journals
eISSN - 2288-159X
pISSN - 2287-5026
DOI - 10.5573/ieie.2016.53.1.107
Subject(s) - skewness , histogram , liquid crystal display , standard deviation , artificial intelligence , similarity (geometry) , computer science , threshold limit value , pattern recognition (psychology) , detection threshold , computer vision , image (mathematics) , mathematics , statistics , real time computing , medicine , environmental health , operating system