Open AccessMethod for Measuring Dielectric Constant of Planar Dielectric Substrate
Author(s) -
ChangHyun Lee,
TaekSun Kwon,
JeongHae Lee
Publication year - 2018
Publication title -
han'gug jeonja'pa haghoe nonmunji/the journal of korean institute of electromagnetic engineering and science
Language(s) - English
Resource type - Journals
eISSN - 2288-226X
pISSN - 1226-3133
DOI - 10.5515/kjkiees.2018.29.10.799
Subject(s) - dielectric , planar , materials science , transmission coefficient , reflection coefficient , reflection (computer programming) , network analyzer (electrical) , constant (computer programming) , substrate (aquarium) , optics , french horn , observational error , high κ dielectric , transmission (telecommunications) , electronic engineering , acoustics , optoelectronics , mathematics , physics , electrical engineering , computer science , engineering , oceanography , computer graphics (images) , geology , programming language , statistics