Open AccessSpectroscopic Characterization of 400℃ Annealed Zn<sub>x</sub>Cd<sub>1-x</sub>S Thin Films
Author(s) -
KwangYong Kang,
Seunghwan Lee,
Nam Kwon Lee,
Jeong-Ju Lee,
Yun-Sik Yu
Publication year - 2015
Publication title -
han'gug jeonja'pa haghoe nonmunji/the journal of korean institute of electromagnetic engineering and science
Language(s) - English
Resource type - Journals
eISSN - 2288-226X
pISSN - 1226-3133
DOI - 10.5515/kjkiees.2015.26.1.101
Subject(s) - x ray photoelectron spectroscopy , materials science , thin film , crystallinity , analytical chemistry (journal) , indium , indium tin oxide , spectroscopy , nanotechnology , optoelectronics , nuclear magnetic resonance , chemistry , physics , chromatography , quantum mechanics , composite material