Open AccessMeasurement of the Noise Parameters of On-Wafer Type DUTs Using 8-Port Network
Author(s) -
Dong-Hyun Lee,
Abdule-Rahman Ahmed,
SungWoo Lee,
KyungWhan Yeom
Publication year - 2014
Publication title -
han'gug jeonja'pa haghoe nonmunji/the journal of korean institute of electromagnetic engineering and science
Language(s) - English
Resource type - Journals
eISSN - 2288-226X
pISSN - 1226-3133
DOI - 10.5515/kjkiees.2014.25.8.808
Subject(s) - attenuator (electronics) , low noise amplifier , noise figure , device under test , electronic engineering , amplifier , electrical engineering , network analyzer (electrical) , y factor , engineering , datasheet , noise (video) , test fixture , scattering parameters , computer science , attenuation , physics , optics , cmos , mechanical engineering , artificial intelligence , image (mathematics)