
Accuracy Examination in the RCS Computation of a Leaf Using the Resistive Sheet Technique with Various Thicknesses and Moisture Contents
Author(s) -
Minseo Park,
Han-Joong Kim,
Kwiseob Um,
Sinmyong Park,
Soon-Koo Kweon,
Yisok Oh
Publication year - 2014
Publication title -
han'gug jeonja'pa haghoe nonmunji/the journal of korean institute of electromagnetic engineering and science
Language(s) - English
Resource type - Journals
eISSN - 2288-226X
pISSN - 1226-3133
DOI - 10.5515/kjkiees.2014.25.11.1183
Subject(s) - resistive touchscreen , dielectric , materials science , radar cross section , backscatter (email) , finite element method , scattering , cross section (physics) , optics , composite material , physics , optoelectronics , electrical engineering , engineering , telecommunications , structural engineering , quantum mechanics , wireless