Open AccessDETERMINATION OF THE COINCIDENCE CORRECTION FACTOR ON MEASURING SEMICONDUCTOR DETECTOR EXPERIMENTAL EFFICIENCY
Author(s) -
Trịnh Văn Cường,
Trần Tuấn Anh,
Hồ Mạnh Dũng,
Hồ Văn Doanh,
Nguyễn Thị Thọ,
Hà Anh Tú
Publication year - 2020
Publication title -
tạp chí khoa học đại học sư phạm thành phố hồ chí minh
Language(s) - English
Resource type - Journals
ISSN - 2734-9918
DOI - 10.54607/hcmue.js.17.9.2597(2020
Subject(s) - coincidence , detector , spectrometer , physics , semiconductor detector , resolution (logic) , optics , semiconductor , neutron , nuclear physics , optoelectronics , medicine , alternative medicine , pathology , artificial intelligence , computer science