Open AccessA Wear-leveling Scheme for NAND Flash Memory based on Update Patterns of Data
Author(s) -
Hyo-Joung Shin,
Don-Jung Choi,
Bo-Keong Kim,
Taebok Yoon,
Jee-Hyong Lee
Publication year - 2010
Publication title -
han-gug jineung siseutem haghoe nonmunji/han-guk jineung siseutem hakoe nonmunji
Language(s) - English
Resource type - Journals
eISSN - 2288-2324
pISSN - 1976-9172
DOI - 10.5391/jkiis.2010.20.6.761
Subject(s) - nand gate , block (permutation group theory) , erasure , computer science , flash file system , flash (photography) , flash memory , computer hardware , computer memory , embedded system , semiconductor memory , algorithm , logic gate , mathematics , art , geometry , visual arts , programming language