Open AccessA Defect Inspection Method in TFT-LCD Panel Using LS-SVM
Author(s) -
Ho-Hyung Choi,
Gunhee Lee,
Ja-Geun Kim,
Young-Bok Joo,
Byung-Jae Choi,
Kil−Houm Park,
Byoung-Ju Yun
Publication year - 2009
Publication title -
han-gug jineung siseutem haghoe nonmunji/han-guk jineung siseutem hakoe nonmunji
Language(s) - English
Resource type - Journals
eISSN - 2288-2324
pISSN - 1976-9172
DOI - 10.5391/jkiis.2009.19.6.852
Subject(s) - artificial intelligence , support vector machine , liquid crystal display , computer vision , cmos , image sensor , feature (linguistics) , cmos sensor , thin film transistor , computer science , engineering , materials science , electronic engineering , linguistics , philosophy , layer (electronics) , composite material , operating system