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Reliability Analysis of Fuzzy Systems Based on Interval Valued Vague Sets
Author(s) -
Se-Yul Lee,
Sang-Yeop Cho,
Yong Soo Kim
Publication year - 2008
Publication title -
journal of korean institute of intelligent systems
Language(s) - English
Resource type - Journals
eISSN - 2288-2324
pISSN - 1976-9172
DOI - 10.5391/jkiis.2008.18.4.445
Subject(s) - mathematics , fuzzy number , interval (graph theory) , fuzzy logic , fuzzy set operations , type 2 fuzzy sets and systems , fuzzy set , reliability (semiconductor) , defuzzification , fuzzy classification , algorithm , discrete mathematics , artificial intelligence , computer science , combinatorics , power (physics) , physics , quantum mechanics

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