
Statistical analysis methods for time varying nanoscale imaging problems
Author(s) -
Oskar Laitenberger
Publication year - 2022
Language(s) - English
Resource type - Dissertations/theses
DOI - 10.53846/goediss-7365
Subject(s) - microscopy , markov chain , resolution (logic) , microscope , diffraction , super resolution microscopy , computer science , optics , biological system , physics , artificial intelligence , machine learning , scanning confocal electron microscopy , biology