Open AccessStatistical analysis methods for time varying nanoscale imaging problems
Author(s) -
Oskar Laitenberger
Publication year - 2019
Language(s) - English
Resource type - Dissertations/theses
DOI - 10.53846/goediss-7365
Subject(s) - microscopy , markov chain , resolution (logic) , microscope , diffraction , super resolution microscopy , computer science , optics , physics , artificial intelligence , mathematics , statistics , scanning confocal electron microscopy
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