
Analysis of Diagnosis and Very Low Frequency Experiment to Detect of Fault on 22.9kV Class Cable
Author(s) -
Young-Seok Kim,
Taek-Hee Kim,
Chong-Min Kim,
Kil-Mok Shong
Publication year - 2016
Publication title -
jeon-gi hakoe nonmunji/jeon'gi haghoe nonmunji
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.174
H-Index - 11
eISSN - 2287-4364
pISSN - 1975-8359
DOI - 10.5370/kiee.2016.65.10.1780
Subject(s) - fault (geology) , power cable , very low frequency , degradation (telecommunications) , electrical engineering , power (physics) , voltage , materials science , low frequency , engineering , forensic engineering , composite material , telecommunications , physics , geology , seismology , layer (electronics) , quantum mechanics