Open AccessTSV Defect Detection Method Using On-Chip Testing Logics
Author(s) -
Jin-Ho Ahn
Publication year - 2014
Publication title -
jeon-gi hakoe nonmunji/jeon'gi haghoe nonmunji
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.174
H-Index - 11
eISSN - 2287-4364
pISSN - 1975-8359
DOI - 10.5370/kiee.2014.63.12.1710
Subject(s) - chip , signal (programming language) , fault detection and isolation , fault (geology) , electronic engineering , computer science , logic gate , embedded system , engineering , electrical engineering , telecommunications , seismology , geology , actuator , programming language